Four Probe- Resistivity Measurement

Four Probe- Resistivity Measurement
Make Dinesh Scientific Model DS-604
Product Description
Four probe apparatus is one of the standard and most widely used apparatus for the measurement of resistivity of semiconductors. This method is employed when the sample is in the form of a thin wafer, such as a thin semiconductor material deposited on a substrate. Four Probe method is one of the standard & most commonly used method for the accurate measurement of resistivity. It overcomes the problem of contact resistance and also offer several other advantages. Accurate resistivity measurement in samples having a variety of shapes is possible by this method.

Specifications:
To measure the of resistivity of semiconductor by four probe method, to determine the Energy Band Gap of the semiconductore. The complete setup should include
• Power Supply:-Voltmeter Display : 7segment LED, auto polarity and decimal indication.
• Voltage Range : X1 (0- 200.0mV DC)(minimum) & X10 (0-2.00 V DC)(minimum);
• Current/Temperature display: 7segment LED,
• Temperature Range : -10 to +200°C @ 1°C,
• Current Range : minimum 0-20 mA DC
• Crystal : Germanium Wafer, P type,
• Resistivity : 1-10 ohm-cm
• Pillar : Spring loaded,Height can be adjusted using three screw mounted on top Four Probe Cable,
• Pin : Spring loaded,
• Probe Spacing : Approx. 2.5 cm.